التفاصيل البيبلوغرافية
العنوان: |
Failure mechanisms of GaN HEMTs for microwave and millimeter-wave applications: from interdiffusion effects to hot-electrons degradation |
المؤلفون: |
Meneghesso, G., Meneghini, M., De Santi, C., Buffolo, M., Rampazzo, F., Chiocchetta, F., Zhan, G., Sharma, C., Zanoni, E. |
المصدر: |
2021 43rd Annual EOS/ESD Symposium (EOS/ESD) EOS/ESD Symposium (EOS/ESD), 2021 43rd Annual. 43:1-8 Sep, 2021 |
Relation: |
2021 43rd Annual EOS/ESD Symposium (EOS/ESD) |
قاعدة البيانات: |
IEEE Xplore Digital Library |