مؤتمر
Failure mechanisms of GaN HEMTs for microwave and millimeter-wave applications: from interdiffusion effects to hot-electrons degradation
| العنوان: | Failure mechanisms of GaN HEMTs for microwave and millimeter-wave applications: from interdiffusion effects to hot-electrons degradation |
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| المؤلفون: | Meneghesso, G., Meneghini, M., De Santi, C., Buffolo, M., Rampazzo, F., Chiocchetta, F., Zhan, G., Sharma, C., Zanoni, E. |
| المصدر: | 2021 43rd Annual EOS/ESD Symposium (EOS/ESD) EOS/ESD Symposium (EOS/ESD), 2021 43rd Annual. 43:1-8 Sep, 2021 |
| Relation: | 2021 43rd Annual EOS/ESD Symposium (EOS/ESD) |
| قاعدة البيانات: | IEEE Xplore Digital Library |
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