مؤتمر
Dynamic On-State Resistance Characterization of GaN FET under Hard-Switching Conditions
| العنوان: | Dynamic On-State Resistance Characterization of GaN FET under Hard-Switching Conditions |
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| المؤلفون: | Khoshzaman, Shima, Tang, Yikai, Hahn, Ingo |
| المصدر: | IECON 2021 – 47th Annual Conference of the IEEE Industrial Electronics Society Industrial Electronics Society (IECON), 2021 47th Annual Conference of the IEEE. :1-5 Oct, 2021 |
| Relation: | IECON 2021 - 47th Annual Conference of the IEEE Industrial Electronics Society |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 9781665435543 |
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| تدمد: | 25771647 |
| DOI: | 10.1109/IECON48115.2021.9589413 |