مؤتمر
Modeling the temperature-dependent reverse breakdown behavior of GaAs PIN diodes
| العنوان: | Modeling the temperature-dependent reverse breakdown behavior of GaAs PIN diodes |
|---|---|
| المؤلفون: | Scharf, P., Velarde Gonzalez, F. A., Lange, A., Dietrich, M., Dudek, V. |
| المصدر: | 2021 International Semiconductor Conference (CAS) Semiconductor Conference (CAS), 2021 International. :81-84 Oct, 2021 |
| Relation: | 2021 International Semiconductor Conference (CAS) |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 9781665435710 |
|---|---|
| تدمد: | 23770678 |
| DOI: | 10.1109/CAS52836.2021.9604151 |