مؤتمر
Total-dose tolerance of the commercial Taiwan Semiconductor Manufacturing Company (TSMC) 0.35-/spl mu/m CMOS process
| العنوان: | Total-dose tolerance of the commercial Taiwan Semiconductor Manufacturing Company (TSMC) 0.35-/spl mu/m CMOS process |
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| المؤلفون: | Lacoe, R.C., Osborn, J.V., Mayer, D.C., Brown, S., Gambles, J. |
| المصدر: | 2001 IEEE Radiation Effects Data Workshop. NSREC 2001. Workshop Record. Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference (Cat. No.01TH8588) Radiation effects data workshop Radiation Effects Data Workshop, 2001 IEEE. :72-76 2001 |
| Relation: | 2001 IEEE Radiation Effects Data Workshop. NSREC 2001. Workshop Record |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 0780371992 9780780371996 |
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| DOI: | 10.1109/REDW.2001.960453 |