Dose monitoring in MeV energy hydrogen implanted silicon by photo-modulated reflectance measurements

التفاصيل البيبلوغرافية
العنوان: Dose monitoring in MeV energy hydrogen implanted silicon by photo-modulated reflectance measurements
المؤلفون: Szivos, J., Balogh, L., Rajta, I., Nagy, G., Samu, V., Takefumi, K., Zolnai, Z.
المصدر: 2021 20th International Workshop on Junction Technology (IWJT) Junction Technology (IWJT), 2021 20th International Workshop on. :1-3 Jun, 2021
Relation: 2021 20th International Workshop on Junction Technology (IWJT)
قاعدة البيانات: IEEE Xplore Digital Library
الوصف
ردمك:9784863487796
DOI:10.23919/IWJT52818.2021.9609394