Development and Characterization of High Temperature Plasma Nitridation Process for Advanced CMOS Technology Application

التفاصيل البيبلوغرافية
العنوان: Development and Characterization of High Temperature Plasma Nitridation Process for Advanced CMOS Technology Application
المؤلفون: Kang, Xiaoxu, Zhong, Xiaolan, Chen, Zhangfa, Dao, Zhengkai, Zhang, Qiang, Wan, Hao, Zhou, Yamin, Li, Ming, Guo, Yingjia, Nie, Ran, Wu, Tao
المصدر: 2021 IEEE 14th International Conference on ASIC (ASICON) ASIC (ASICON), 2021 IEEE 14th International Conference on. :1-3 Oct, 2021
Relation: 2021 IEEE 14th International Conference on ASIC (ASICON)
قاعدة البيانات: IEEE Xplore Digital Library
الوصف
ردمك:9781665438674
تدمد:2162755X
DOI:10.1109/ASICON52560.2021.9620365