مؤتمر
Dynamic Voltage Stress Sensing Circuits for Screening Out Early Device Reliability Issues in Advanced Technology Nodes
| العنوان: | Dynamic Voltage Stress Sensing Circuits for Screening Out Early Device Reliability Issues in Advanced Technology Nodes |
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| المؤلفون: | Oh, Ghil-Geun, Ho, Min-Hye, Shin, Yeon-Jung, Choi, Jae-Wook, Kim, Ju-Youn, Kim, Young-Dae |
| المصدر: | 2021 IEEE Asian Solid-State Circuits Conference (A-SSCC) Solid-State Circuits Conference (A-SSCC), 2021 IEEE Asian. :1-3 Nov, 2021 |
| Relation: | 2021 IEEE Asian Solid-State Circuits Conference (A-SSCC) |
| قاعدة البيانات: | IEEE Xplore Digital Library |
| ردمك: | 9781665443500 |
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| DOI: | 10.1109/A-SSCC53895.2021.9634812 |