Characterization of Low Loss Dielectric Materials for 5G Applications

التفاصيل البيبلوغرافية
العنوان: Characterization of Low Loss Dielectric Materials for 5G Applications
المؤلفون: Lee, Tzu Nien, Lau, John H, Ko, Cheng-Ta, Xia, Tim, Lin, Eagle, Yang, Henry Kai-Ming, Lin, Puru Bruce, Peng, Tony Chia-Yu, Chang, Leo, Chen, Jia Shiang, Fang, Yi-Hsiu, Liao, Li-Yueh, Charn, Edward, Wang, Jason, Tseng, Tzyy-Jang
المصدر: 2021 IEEE CPMT Symposium Japan (ICSJ) CPMT Symposium Japan (ICSJ), 2021 IEEE. :98-101 Nov, 2021
Relation: 2021 IEEE CPMT Symposium Japan (ICSJ)
قاعدة البيانات: IEEE Xplore Digital Library
الوصف
ردمك:9781665440790
تدمد:24758418
DOI:10.1109/ICSJ52620.2021.9648855