A Scan-Based Lower-Power Testing Architecture for Modern Circuits

التفاصيل البيبلوغرافية
العنوان: A Scan-Based Lower-Power Testing Architecture for Modern Circuits
المؤلفون: Rau, Jiann-Chyi, Wang, Jia-Xiang
المصدر: 2021 International Symposium on Intelligent Signal Processing and Communication Systems (ISPACS) Intelligent Signal Processing and Communication Systems (ISPACS),2021 International Symposium on. :1-2 Nov, 2021
Relation: 2021 International Symposium on Intelligent Signal Processing and Communication Systems (ISPACS)
قاعدة البيانات: IEEE Xplore Digital Library
الوصف
ردمك:9781665419512
9781665419505
DOI:10.1109/ISPACS51563.2021.9651069