مؤتمر
A Scan-Based Lower-Power Testing Architecture for Modern Circuits
العنوان: | A Scan-Based Lower-Power Testing Architecture for Modern Circuits |
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المؤلفون: | Rau, Jiann-Chyi, Wang, Jia-Xiang |
المصدر: | 2021 International Symposium on Intelligent Signal Processing and Communication Systems (ISPACS) Intelligent Signal Processing and Communication Systems (ISPACS),2021 International Symposium on. :1-2 Nov, 2021 |
Relation: | 2021 International Symposium on Intelligent Signal Processing and Communication Systems (ISPACS) |
قاعدة البيانات: | IEEE Xplore Digital Library |
ردمك: | 9781665419512 9781665419505 |
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DOI: | 10.1109/ISPACS51563.2021.9651069 |