دورية أكاديمية
Analysis of Heavy-Ion-Induced Leakage Current in SiC Power Devices
| العنوان: | Analysis of Heavy-Ion-Induced Leakage Current in SiC Power Devices |
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| المؤلفون: | Johnson, R.A., Witulski, A.F., Ball, D.R., Galloway, K.F., Sternberg, A.L., Reed, R.A., Schrimpf, R.D., Alles, M.L., Lauenstein, J., Hutson, J.M. |
| المصدر: | IEEE Transactions on Nuclear Science IEEE Trans. Nucl. Sci. Nuclear Science, IEEE Transactions on. 69(3):248-253 Mar, 2022 |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | تدمد: | 00189499 15581578 |
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| DOI: | 10.1109/TNS.2021.3136806 |