مؤتمر
Embedded DRAM built in self test and methodology for test insertion
| العنوان: | Embedded DRAM built in self test and methodology for test insertion |
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| المؤلفون: | Jakobsen, P., Dreibelbis, J., Pomichter, G., Anand, D., Barth, J., Nelms, M., Leach, J., Belansek, G. |
| المصدر: | Proceedings International Test Conference 2001 (Cat. No.01CH37260) International test conference Test Conference, 2001. Proceedings. International. :975-984 2001 |
| Relation: | Proceedings International Test Conference |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 0780371690 9780780371699 |
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| تدمد: | 10893539 |
| DOI: | 10.1109/TEST.2001.966722 |