التفاصيل البيبلوغرافية
| العنوان: |
IFIZZ: Deep-State and Efficient Fault-Scenario Generation to Test IoT Firmware |
| المؤلفون: |
Liu, Peiyu, Ji, Shouling, Zhang, Xuhong, Dai, Qinming, Lu, Kangjie, Fu, Lirong, Chen, Wenzhi, Cheng, Peng, Wang, Wenhai, Beyah, Raheem |
| المصدر: |
2021 36th IEEE/ACM International Conference on Automated Software Engineering (ASE) ASE Automated Software Engineering (ASE), 2021 36th IEEE/ACM International Conference on. :805-816 Nov, 2021 |
| Relation: |
2021 36th IEEE/ACM International Conference on Automated Software Engineering (ASE) |
| قاعدة البيانات: |
IEEE Xplore Digital Library |
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