التفاصيل البيبلوغرافية
العنوان: |
IFIZZ: Deep-State and Efficient Fault-Scenario Generation to Test IoT Firmware |
المؤلفون: |
Liu, Peiyu, Ji, Shouling, Zhang, Xuhong, Dai, Qinming, Lu, Kangjie, Fu, Lirong, Chen, Wenzhi, Cheng, Peng, Wang, Wenhai, Beyah, Raheem |
المصدر: |
2021 36th IEEE/ACM International Conference on Automated Software Engineering (ASE) ASE Automated Software Engineering (ASE), 2021 36th IEEE/ACM International Conference on. :805-816 Nov, 2021 |
Relation: |
2021 36th IEEE/ACM International Conference on Automated Software Engineering (ASE) |
قاعدة البيانات: |
IEEE Xplore Digital Library |