دورية أكاديمية
Robust Through-Fin Avalanche in Vertical GaN Fin-JFET With Soft Failure Mode
| العنوان: | Robust Through-Fin Avalanche in Vertical GaN Fin-JFET With Soft Failure Mode |
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| المؤلفون: | Zhang, R., Liu, J., Li, Q., Pidaparthi, S., Edwards, A., Drowley, C., Zhang, Y. |
| المصدر: | IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 43(3):366-369 Mar, 2022 |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | تدمد: | 07413106 15580563 |
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| DOI: | 10.1109/LED.2022.3144698 |