مؤتمر
InGaAs/InP SPAD detecting single photons at 1550 nm with up to 50% efficiency and low noise
| العنوان: | InGaAs/InP SPAD detecting single photons at 1550 nm with up to 50% efficiency and low noise |
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| المؤلفون: | Signorelli, F., Telesca, F., Conca, E., Frera, A. Della, Ruggeri, A., Giudice, A., Tosi, A. |
| المصدر: | 2021 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2021 IEEE International. :20.3.1-20.3.4 Dec, 2021 |
| Relation: | 2021 IEEE International Electron Devices Meeting (IEDM) |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 9781665425728 |
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| تدمد: | 2156017X |
| DOI: | 10.1109/IEDM19574.2021.9720559 |