مؤتمر
Wafer map defect recognition with few shot learning based on hybrid self-attention mechanism and prototype network
العنوان: | Wafer map defect recognition with few shot learning based on hybrid self-attention mechanism and prototype network |
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المؤلفون: | Yu, Naigong, Chen, Huaisheng, Xu, Qiao, Hasan, Mohammad Mehedi |
المصدر: | 2021 China Automation Congress (CAC) Automation Congress (CAC), 2021 China. :4128-4134 Oct, 2021 |
Relation: | 2021 China Automation Congress (CAC) |
قاعدة البيانات: | IEEE Xplore Digital Library |
ردمك: | 9781665426473 |
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تدمد: | 26880938 |
DOI: | 10.1109/CAC53003.2021.9727346 |