مؤتمر
Wafer Map Defect Pattern Recognition Based on Self-Organizing Incremental Neural Network
| العنوان: | Wafer Map Defect Pattern Recognition Based on Self-Organizing Incremental Neural Network |
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| المؤلفون: | Yu, Naigong, Xu, Qiao, Hasan, Mohammad Mehedi, Jiang, Kai |
| المصدر: | 2021 China Automation Congress (CAC) Automation Congress (CAC), 2021 China. :5617-5622 Oct, 2021 |
| Relation: | 2021 China Automation Congress (CAC) |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 9781665426473 |
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| تدمد: | 26880938 |
| DOI: | 10.1109/CAC53003.2021.9728184 |