دورية أكاديمية
Test Methodology for Defect-Based Bridge Faults
| العنوان: | Test Methodology for Defect-Based Bridge Faults |
|---|---|
| المؤلفون: | Chang, S., Nien, Y., Hu, Y., Wu, K., Wang, C., Huang, F., Tang, Y., Chen, Y., Chen, M., Chao, M.C. |
| المصدر: | IEEE Transactions on Very Large Scale Integration (VLSI) Systems IEEE Trans. VLSI Syst. Very Large Scale Integration (VLSI) Systems, IEEE Transactions on. 30(7):975-988 Jul, 2022 |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | تدمد: | 10638210 15579999 |
|---|---|
| DOI: | 10.1109/TVLSI.2022.3154535 |