SiC GTOs Thyristor for Long Term Reliability on Pulsed Power Application Test

التفاصيل البيبلوغرافية
العنوان: SiC GTOs Thyristor for Long Term Reliability on Pulsed Power Application Test
المؤلفون: Tsoi, Tsz, Whitworth, Chase, Kim, Matthew, Bayne, Stephen, O'Brien, Heather, Ogunniyi, Aderinto
المصدر: 2021 IEEE Pulsed Power Conference (PPC) Pulsed Power Conference (PPC), 2021 IEEE. :1-4 Dec, 2021
Relation: 2021 IEEE Pulsed Power Conference (PPC)
قاعدة البيانات: IEEE Xplore Digital Library
الوصف
ردمك:9781665433471
تدمد:21584923
DOI:10.1109/PPC40517.2021.9733125