مؤتمر
Pulse-modulation Eddy Current Imaging and Evaluation of Hidden Flaws in Layered Conductors
| العنوان: | Pulse-modulation Eddy Current Imaging and Evaluation of Hidden Flaws in Layered Conductors |
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| المؤلفون: | Liu, Zhengshuai, Li, Yong, Ren, Shuting, Ren, Yanzhao, Yan, Bei, Chen, Zhenmao |
| المصدر: | 2021 IEEE Far East NDT New Technology & Application Forum (FENDT) New Technology & Application Forum (FENDT), 2021 IEEE Far East NDT. :303-308 Dec, 2021 |
| Relation: | 2021 IEEE Far East NDT New Technology & Application Forum (FENDT) |
| قاعدة البيانات: | IEEE Xplore Digital Library |
| ردمك: | 9781665401593 |
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| DOI: | 10.1109/FENDT54151.2021.9749679 |