Survey on Data Leakage Prevention through Machine Learning Algorithms

التفاصيل البيبلوغرافية
العنوان: Survey on Data Leakage Prevention through Machine Learning Algorithms
المؤلفون: Agrawal, Er. Garima, Goyal, Dr. Samta Jain
المصدر: 2022 International Mobile and Embedded Technology Conference (MECON) Mobile and Embedded Technology Conference (MECON), 2022 International. :121-123 Mar, 2022
Relation: 2022 International Mobile and Embedded Technology Conference (MECON)
قاعدة البيانات: IEEE Xplore Digital Library
الوصف
ردمك:9781665420204
DOI:10.1109/MECON53876.2022.9752047