مؤتمر
Survey on Data Leakage Prevention through Machine Learning Algorithms
العنوان: | Survey on Data Leakage Prevention through Machine Learning Algorithms |
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المؤلفون: | Agrawal, Er. Garima, Goyal, Dr. Samta Jain |
المصدر: | 2022 International Mobile and Embedded Technology Conference (MECON) Mobile and Embedded Technology Conference (MECON), 2022 International. :121-123 Mar, 2022 |
Relation: | 2022 International Mobile and Embedded Technology Conference (MECON) |
قاعدة البيانات: | IEEE Xplore Digital Library |
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