التفاصيل البيبلوغرافية
| العنوان: |
Failure analysis addressing method of optically undetected defectivity on 4H-SiC PowerMOSFET epitaxial layer |
| المؤلفون: |
Alessandrino, S., Carbone, B., Cordiano, F., Mazza, B., Russo, A., Coco, W., Boscaglia, M., Salvo, A. Di, Lombardo, A., Scarcella, D., Vitanza, E., Fiorenza, P. |
| المصدر: |
2022 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2022 IEEE International. :P61-1-P61-4 Mar, 2022 |
| Relation: |
2022 IEEE International Reliability Physics Symposium (IRPS) |
| قاعدة البيانات: |
IEEE Xplore Digital Library |
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