مؤتمر
Transistor Reliability Characterization for Advanced DRAM with HK+MG & EUV process technology
| العنوان: | Transistor Reliability Characterization for Advanced DRAM with HK+MG & EUV process technology |
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| المؤلفون: | Lee, N-H, Lee, S., Kim, S-H, Kim, G-J, Lee, KW., Lee, YS., Hwang, YC., Kim, HS., Pae, S. |
| المصدر: | 2022 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2022 IEEE International. :6A.1-1-6A.1-6 Mar, 2022 |
| Relation: | 2022 IEEE International Reliability Physics Symposium (IRPS) |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 9781665479509 |
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| تدمد: | 19381891 |
| DOI: | 10.1109/IRPS48227.2022.9764439 |