التفاصيل البيبلوغرافية
| العنوان: |
Bias Temperature Instability (BTI) of High-Voltage Devices for Memory Periphery |
| المؤلفون: |
Bastos, J. P., O'Sullivan, B. J., Franco, J., Tyaginov, S., Truijen, B., Chasin, A., Degraeve, R., Kaczer, B., Ritzenthaler, R., Capogreco, E., Litta, E. D., Spessot, A., Higashi, Y., Yoon, Y., Machkaoutsan, V., Fazan, P., Horiguchi, N. |
| المصدر: |
2022 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2022 IEEE International. :1-6 Mar, 2022 |
| Relation: |
2022 IEEE International Reliability Physics Symposium (IRPS) |
| قاعدة البيانات: |
IEEE Xplore Digital Library |
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