مؤتمر
Towards the Characterization of Full ID-VG Degradation in Transistors for Future Analog Applications
| العنوان: | Towards the Characterization of Full ID-VG Degradation in Transistors for Future Analog Applications |
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| المؤلفون: | Ren, Pengpeng, Zhang, Xinfa, Liu, Junhua, Wang, Runsheng, Ji, Zhigang, Huang, Ru |
| المصدر: | 2022 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2022 IEEE International. :3A.4-1-3A.4-5 Mar, 2022 |
| Relation: | 2022 IEEE International Reliability Physics Symposium (IRPS) |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 9781665479509 |
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| تدمد: | 19381891 |
| DOI: | 10.1109/IRPS48227.2022.9764579 |