Wafer-Level Aging of InGaAs/GaAs Nano-Ridge p-i-n Diodes Monolithically Integrated on Silicon

التفاصيل البيبلوغرافية
العنوان:	Wafer-Level Aging of InGaAs/GaAs Nano-Ridge p-i-n Diodes Monolithically Integrated on Silicon
المؤلفون:	Hsieh, Ping-Yi, Tsiara, Artemisia, O'Sullivan, Barry, Yudistira, Didit, Baryshnikova, Marina, Groeseneken, Guido, Kunert, Bernardette, Pantouvaki, Marianna, Campenhout, Joris Van, De Wolf, Ingrid
المصدر:	2022 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2022 IEEE International. :9A.3-1-9A.3-9 Mar, 2022
Relation:	2022 IEEE International Reliability Physics Symposium (IRPS)
قاعدة البيانات:	IEEE Xplore Digital Library