دورية أكاديمية
Influence of Punch Trough Stop Layer and Well Depths on the Robustness of Bulk FinFETs to Heavy Ions Impact
| العنوان: | Influence of Punch Trough Stop Layer and Well Depths on the Robustness of Bulk FinFETs to Heavy Ions Impact |
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| المؤلفون: | Calomarde, A., Manich, S., Rubio, A., Gamiz, F. |
| المصدر: | IEEE Access Access, IEEE. 10:47169-47178 2022 |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | تدمد: | 21693536 |
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| DOI: | 10.1109/ACCESS.2022.3171813 |