A Novel Physical Unclonable Function: NBTI-PUF Realized by Random Trap Fluctuation (RTF) Enhanced True Randomness in 14 nm FinFET Platform

التفاصيل البيبلوغرافية
العنوان: A Novel Physical Unclonable Function: NBTI-PUF Realized by Random Trap Fluctuation (RTF) Enhanced True Randomness in 14 nm FinFET Platform
المؤلفون: Lin, L. C., Hsieh, E R., Kao, T. C., Lee, M. Y., Chang, J. K., Guo, J. C., Chung, S. S., Chen, T. P., Huang, S. A., Chen, T. J., Cheng, O.
المصدر: 2022 International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA) VLSI Technology, Systems and Applications (VLSI-TSA), 2022 International Symposium on. :1-2 Apr, 2022
Relation: 2022 International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA)
قاعدة البيانات: IEEE Xplore Digital Library
الوصف
ردمك:9781665409230
DOI:10.1109/VLSI-TSA54299.2022.9770980