مؤتمر
Heavy-Ion Induced Single Event Transients in Sub-7nm Bulk and SOI NSFETs
| العنوان: | Heavy-Ion Induced Single Event Transients in Sub-7nm Bulk and SOI NSFETs |
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| المؤلفون: | Jha, Chandan Kumar, Rathi, Aarti, Yogi, Pritam, Aditya, Kritika, Dixit, Abhisek |
| المصدر: | 2020 5th IEEE International Conference on Emerging Electronics (ICEE) Emerging Electronics (ICEE), 2020 5th IEEE International Conference on. :1-4 Nov, 2020 |
| Relation: | 2020 5th IEEE International Conference on Emerging Electronics (ICEE) |
| قاعدة البيانات: | IEEE Xplore Digital Library |
| ردمك: | 9781728186603 |
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| DOI: | 10.1109/ICEE50728.2020.9776740 |