A Physics based MTJ Compact Model for State-of-the-Art and Emerging STT-MRAM Failure Analysis and Yield Enhancement

التفاصيل البيبلوغرافية
العنوان:	A Physics based MTJ Compact Model for State-of-the-Art and Emerging STT-MRAM Failure Analysis and Yield Enhancement
المؤلفون:	Gaul, Nishtha S., Jaiswal, Akhilesh, Yoon, Hongsik, Lee, Taeyoung, Yamane, Kazutaka, Versaggi, Joe, Carter, Rick, Paul, Bipul C.
المصدر:	2022 IEEE International Memory Workshop (IMW) Memory Workshop (IMW), 2022 IEEE International. :1-4 May, 2022
Relation:	2022 IEEE International Memory Workshop (IMW)
قاعدة البيانات:	IEEE Xplore Digital Library