دورية أكاديمية
On the Correlation Between Near-Field Scan Immunity and Radiated Immunity at Printed Circuit Board Level – Part II
| العنوان: | On the Correlation Between Near-Field Scan Immunity and Radiated Immunity at Printed Circuit Board Level – Part II |
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| المؤلفون: | Boyer, A., Nolhier, N., Caignet, F., Dhia, S.B. |
| المصدر: | IEEE Transactions on Electromagnetic Compatibility IEEE Trans. Electromagn. Compat. Electromagnetic Compatibility, IEEE Transactions on. 64(5):1493-1505 Oct, 2022 |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | تدمد: | 00189375 1558187X |
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| DOI: | 10.1109/TEMC.2022.3172601 |