التفاصيل البيبلوغرافية
| العنوان: |
Automatically Identifying Shared Root Causes of Test Breakages in SAP HANA |
| المؤلفون: |
An, Gabin, Yoon, Juyeon, Sohn, Jeongju, Hong, Jingun, Hwang, Dongwon, Yoo, Shin |
| المصدر: |
2022 IEEE/ACM 44th International Conference on Software Engineering: Software Engineering in Practice (ICSE-SEIP) ICSE-SEIP Software Engineering: Software Engineering in Practice (ICSE-SEIP), 2022 IEEE/ACM 44th International Conference on. :65-74 May, 2022 |
| Relation: |
2022 IEEE/ACM 44th International Conference on Software Engineering: Software Engineering in Practice (ICSE-SEIP) |
| قاعدة البيانات: |
IEEE Xplore Digital Library |
