مؤتمر
Accurate Estimation of Test Pattern Counts for a Wide-Range of EDT Input/Output Channel Configurations
| العنوان: | Accurate Estimation of Test Pattern Counts for a Wide-Range of EDT Input/Output Channel Configurations |
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| المؤلفون: | Zheng, Shi-Xuan, Yeh, Chung-Yu, Lee, Kuen-Jong, Wang, Chen, Cheng, Wu-Tung, Kassab, Mark, Rajski, Janusz, Reddy, Sudhakar M. |
| المصدر: | 2022 IEEE 40th VLSI Test Symposium (VTS) VLSI Test Symposium (VTS), 2022 IEEE 40th. :1-7 Apr, 2022 |
| Relation: | 2022 IEEE 40th VLSI Test Symposium (VTS) |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 9781665410601 9781665410595 |
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| تدمد: | 23751053 |
| DOI: | 10.1109/VTS52500.2021.9794207 |