Probing the states around the charge neutrality point of reduced graphene oxide with time-resolved gated Kelvin Probe Force Microscopy

التفاصيل البيبلوغرافية
العنوان: Probing the states around the charge neutrality point of reduced graphene oxide with time-resolved gated Kelvin Probe Force Microscopy
المؤلفون: S, Ragul, Dutta, Soumya, Ray, Debdutta
المصدر: 2022 IEEE International IOT, Electronics and Mechatronics Conference (IEMTRONICS) IOT, Electronics and Mechatronics Conference (IEMTRONICS), 2022 IEEE International. :1-7 Jun, 2022
Relation: 2022 IEEE International IOT, Electronics and Mechatronics Conference (IEMTRONICS)
قاعدة البيانات: IEEE Xplore Digital Library
الوصف
ردمك:9781665486842
DOI:10.1109/IEMTRONICS55184.2022.9795805