مؤتمر
Cross-layer Designs against Non-ideal Effects in ReRAM-based Processing-in-Memory System
| العنوان: | Cross-layer Designs against Non-ideal Effects in ReRAM-based Processing-in-Memory System |
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| المؤلفون: | Nie, Chen, Wang, Zongwu, Tang, Qidong, Lv, Chenyang, Jiang, Li, He, Zhezhi |
| المصدر: | 2022 23rd International Symposium on Quality Electronic Design (ISQED) Quality Electronic Design (ISQED), 2022 23rd International Symposium on. :1-6 Apr, 2022 |
| Relation: | 2022 23rd International Symposium on Quality Electronic Design (ISQED) |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 9781665494663 9781665494656 |
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| تدمد: | 19483295 |
| DOI: | 10.1109/ISQED54688.2022.9806294 |