مؤتمر
Machine learning based soft error rate estimation of pass transistor logic in high-speed communication
| العنوان: | Machine learning based soft error rate estimation of pass transistor logic in high-speed communication |
|---|---|
| المؤلفون: | Zhang, Z., Lappas, J., Chinazzo, A., Weis, C., Wu, Z., Ni, L., Wehn, N., Tahoori, M. |
| المصدر: | 2022 IEEE European Test Symposium (ETS) Test Symposium (ETS), 2022 IEEE European. :1-4 May, 2022 |
| Relation: | 2022 IEEE European Test Symposium (ETS) |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 9781665467063 9781665467056 |
|---|---|
| تدمد: | 15581780 |
| DOI: | 10.1109/ETS54262.2022.9810410 |