A Study on Warpage and Reflow Profile for Extreme Extension of Mass Reflow Bonding

التفاصيل البيبلوغرافية
العنوان: A Study on Warpage and Reflow Profile for Extreme Extension of Mass Reflow Bonding
المؤلفون: Shin, Jiwon, Woo, Kwangbok, Kwon, Donguk, Kim, Youngja, Lee, Youngmin, Kang, Dongwoo, Sahoo, Krutikesh, Ren, Haoxiang, Huang, Yu-Pei, Shah, Ujash, Yang, Yutao, Kuchhangi, Ankit, Iyer, Subramanian S.
المصدر: 2022 IEEE 72nd Electronic Components and Technology Conference (ECTC) ECTC Electronic Components and Technology Conference (ECTC), 2022 IEEE 72nd. :1158-1162 May, 2022
Relation: 2022 IEEE 72nd Electronic Components and Technology Conference (ECTC)
قاعدة البيانات: IEEE Xplore Digital Library
الوصف
ردمك:9781665479431
تدمد:23775726
DOI:10.1109/ECTC51906.2022.00187