Study on the deep energy levels in neutron-irradiated Czochralski-grown silicon

التفاصيل البيبلوغرافية
العنوان: Study on the deep energy levels in neutron-irradiated Czochralski-grown silicon
المؤلفون: Caichi Liu, Qiuyan Hao, Haiyun Wang, Bingyan Ren, Yangxian Li, Yuesheng Xu
المصدر: 2001 6th International Conference on Solid-State and Integrated Circuit Technology. Proceedings (Cat. No.01EX443) Solid-state and integrated circuit technology Solid-State and Integrated-Circuit Technology, 2001. Proceedings. 6th International Conference on. 2:1099-1101 vol.2 2001
Relation: Proceedings of 6th International Conference on Solid-State and IC Technology
قاعدة البيانات: IEEE Xplore Digital Library
الوصف
ردمك:0780365208
9780780365209
DOI:10.1109/ICSICT.2001.982090