دورية أكاديمية
Keeping Deep Lithography Simulators Updated: Global–Local Shape-Based Novelty Detection and Active Learning
العنوان: | Keeping Deep Lithography Simulators Updated: Global–Local Shape-Based Novelty Detection and Active Learning |
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المؤلفون: | Shao, H., Ping, H., Chen, K., Su, W., Lin, C., Fang, S., Tsai, P., Liu, Y. |
المصدر: | IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst. Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on. 42(3):1000-1014 Mar, 2023 |
قاعدة البيانات: | IEEE Xplore Digital Library |
تدمد: | 02780070 19374151 |
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DOI: | 10.1109/TCAD.2022.3192175 |