دورية أكاديمية
Evaluating On-State Voltage and Junction Temperature Monitoring Concepts for Wide-Bandgap Semiconductor Devices
| العنوان: | Evaluating On-State Voltage and Junction Temperature Monitoring Concepts for Wide-Bandgap Semiconductor Devices |
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| المؤلفون: | Fritz, N., Kamp, T., Polom, T.A., Friedel, M., Doncker, R.W.D. |
| المصدر: | IEEE Transactions on Industry Applications IEEE Trans. on Ind. Applicat. Industry Applications, IEEE Transactions on. 58(6):7550-7561 Jan, 2022 |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | تدمد: | 00939994 19399367 |
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| DOI: | 10.1109/TIA.2022.3191632 |