مؤتمر
On the Influence of Metal Chucks in Wideband On-Wafer Measurements
العنوان: | On the Influence of Metal Chucks in Wideband On-Wafer Measurements |
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المؤلفون: | Phung, Gia Ngoc, ArZ, Uwe |
المصدر: | 2022 98th ARFTG Microwave Measurement Conference (ARFTG) ARFTG Microwave Measurement Conference (ARFTG), 2022 98th. :1-4 Jan, 2022 |
Relation: | 2022 98th ARFTG Microwave Measurement Conference (ARFTG) |
قاعدة البيانات: | IEEE Xplore Digital Library |
ردمك: | 9781665406628 |
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DOI: | 10.1109/ARFTG52954.2022.9844119 |