مؤتمر
Analysis of BTI in 300 mm integrated dual-gate WS2 FETs
| العنوان: | Analysis of BTI in 300 mm integrated dual-gate WS2 FETs |
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| المؤلفون: | Panarella, L., Smets, Q., Verreck, D., Schram, T., Cott, D., Asselberghs, I., Kaczer, B. |
| المصدر: | 2022 Device Research Conference (DRC) Device Research Conference (DRC), 2022. :1-2 Jun, 2022 |
| Relation: | 2022 Device Research Conference (DRC) |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 9781665498838 |
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| تدمد: | 26406853 |
| DOI: | 10.1109/DRC55272.2022.9855819 |