التفاصيل البيبلوغرافية
العنوان: |
Holistic Approach to Measure Sample-level Adversarial Vulnerability and its Utility in Building Trustworthy Systems |
المؤلفون: |
Nayak, Gaurav Kumar, Rawal, Ruchit, Lal, Rohit, Patil, Himanshu, Chakraborty, Anirban |
المصدر: |
2022 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops (CVPRW) CVPRW Computer Vision and Pattern Recognition Workshops (CVPRW), 2022 IEEE/CVF Conference on. :4331-4340 Jun, 2022 |
Relation: |
2022 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops (CVPRW) |
قاعدة البيانات: |
IEEE Xplore Digital Library |