Holistic Approach to Measure Sample-level Adversarial Vulnerability and its Utility in Building Trustworthy Systems

التفاصيل البيبلوغرافية
العنوان:	Holistic Approach to Measure Sample-level Adversarial Vulnerability and its Utility in Building Trustworthy Systems
المؤلفون:	Nayak, Gaurav Kumar, Rawal, Ruchit, Lal, Rohit, Patil, Himanshu, Chakraborty, Anirban
المصدر:	2022 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops (CVPRW) CVPRW Computer Vision and Pattern Recognition Workshops (CVPRW), 2022 IEEE/CVF Conference on. :4331-4340 Jun, 2022
Relation:	2022 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops (CVPRW)
قاعدة البيانات:	IEEE Xplore Digital Library