مؤتمر
Advanced TCAD Simulation of Tunnel Oxide Degradation for EEPROM Applications
| العنوان: | Advanced TCAD Simulation of Tunnel Oxide Degradation for EEPROM Applications |
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| المؤلفون: | Matteo, F., Simola, R., Postel-Pellerin, J., Coulie, K. |
| المصدر: | 2022 IEEE 4th International Conference on Dielectrics (ICD) Dielectrics (ICD), 2022 IEEE 4th International Conference on. :764-768 Jul, 2022 |
| Relation: | 2022 IEEE 4th International Conference on Dielectrics (ICD) |
| قاعدة البيانات: | IEEE Xplore Digital Library |
| ردمك: | 9781665418331 |
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| DOI: | 10.1109/ICD53806.2022.9863611 |