التفاصيل البيبلوغرافية
العنوان: |
Atomic Force Microscope Characterization of the Bending Stiffness and Surface Topography of Silicon and Polymeric Electrodes |
المؤلفون: |
Riggins, Ti'Air E., Li, Wen, Purcell, Erin K. |
المصدر: |
2022 44th Annual International Conference of the IEEE Engineering in Medicine & Biology Society (EMBC) Engineering in Medicine & Biology Society (EMBC), 2022 44th Annual International Conference of the IEEE. :2348-2352 Jul, 2022 |
Relation: |
2022 44th Annual International Conference of the IEEE Engineering in Medicine & Biology Society (EMBC) |
قاعدة البيانات: |
IEEE Xplore Digital Library |