مؤتمر
Atomic Force Microscope Characterization of the Bending Stiffness and Surface Topography of Silicon and Polymeric Electrodes
| العنوان: | Atomic Force Microscope Characterization of the Bending Stiffness and Surface Topography of Silicon and Polymeric Electrodes |
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| المؤلفون: | Riggins, Ti'Air E., Li, Wen, Purcell, Erin K. |
| المصدر: | 2022 44th Annual International Conference of the IEEE Engineering in Medicine & Biology Society (EMBC) Engineering in Medicine & Biology Society (EMBC), 2022 44th Annual International Conference of the IEEE. :2348-2352 Jul, 2022 |
| Relation: | 2022 44th Annual International Conference of the IEEE Engineering in Medicine & Biology Society (EMBC) |
| قاعدة البيانات: | IEEE Xplore Digital Library |
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