Test Structure of Bi-stable Spring towards TopoMEMS Ising Machine

التفاصيل البيبلوغرافية
العنوان: Test Structure of Bi-stable Spring towards TopoMEMS Ising Machine
المؤلفون: Mita, Yoshio, Ezawa, Motohiko, Tsuji, Keigo, Lebrasseur, Eric, Sawamura, Tomoki, Tsuboi, Shinji, Mizushima, Ayako, Ochiai, Yukinori, Higo, Akio
المصدر: 2022 IEEE 34th International Conference on Microelectronic Test Structures (ICMTS) Microelectronic Test Structures (ICMTS), 2022 IEEE 34th International Conference on. :1-4 Mar, 2022
Relation: 2022 IEEE 34th International Conference on Microelectronic Test Structures (ICMTS)
قاعدة البيانات: IEEE Xplore Digital Library
الوصف
ردمك:9781665485661
تدمد:21581029
DOI:10.1109/ICMTS50340.2022.9898227