مؤتمر
EB-testing-pad method and its evaluation by actual devices
| العنوان: | EB-testing-pad method and its evaluation by actual devices |
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| المؤلفون: | Kuji, N., Ishihara, T. |
| المصدر: | Proceedings 10th Asian Test Symposium Asian test symposium Test Symposium, 2001. Proceedings. 10th Asian. :179-184 2001 |
| Relation: | Tenth Asian Test Symposium |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 0769513786 9780769513782 |
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| تدمد: | 10817735 |
| DOI: | 10.1109/ATS.2001.990278 |